Professor Alex Volinsky

Professor Alex Volinsky

by Professor Alex Volinsky

Ep 516: One Scale to Rule the Small

Length Scales for the Fracture of Nanostructures https://doi.org/10.1023/a:1024927812734

Ep 515: Squeezing the Glass Sponge

Mechanical Properties and Fracture Toughness of Organosilicate Glass (OSG) Lowk Dielectric Thin Films for Microelectronic Application https://doi.org/10.1023/a:1024944316369

Ep 514: When the Glue Walks Away

Effects of Diffusion on Interfacial Fracture of Goldchromium Hybrid Microcircuit Film https://doi.org/10.1023/a:1024979829573

Ep 513: The Reliability Field Manual

Nanoindentation Techniques for Assessing Mechanical Reliability at Nanoscale https://doi.org/10.1016/s0167-9317(03)00341-1

Ep 512: Editing the Field Into Being

Microelectronic Engineering

Ep 511: The Manual for Breaking Interfaces

Nanoindentation Methods in Interfacial Fracture Testing, Chapter 13 in Comprehensive Structural Integrity

Ep 510: A Thermometer Made of Damage

Irradiated Single Crystals for High Temperature Measurements in Space Applications https://doi.org/10.1557/proc-851-nn1.4

Ep 509: Slow Cracks, True Adhesion

Sub-Critical Telephone Cord Delamination Propagation and Adhesion Measurements https://doi.org/10.1557/proc-854-u9.5

Ep 508: Failure Hired as Fabricator

Microfluidics Applications of Telephone Cord Delamination Blisters https://doi.org/10.1557/proc-855-w3.16

Ep 507: The Crack Tip Is Allowed to Turn

Effects of Neartip Rotation on Prebuckle Crack Growth of Compressed Beams Bonded to a Rigid Substrate https://doi.org/10.1016/j.ijsolstr.2003.10.002
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