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Professor Alex Volinsky
por Professor Alex Volinsky
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Episodios
Detalles
Ep 506: Hot Hardness
Nanoindentation of Au and Pt/Cu Thin Films at Elevated Temperatures https://doi.org/10.1557/jmr.2004.0331
Ep 505: Bending a Multilayer Mirror
Tensile Crack Patterns in Mo/Si Multilayers on Si Substrates Under Hightemperature Bending https://doi.org/10.1007/s00339-003-2340-0
Ep 504: Two Pages That Named a Field
Foreword: Microelectronic Engineering Special Issue: Characterization and Mechanical Reliability of Advanced Electronic Materials at Nanoscale
Ep 503: Autopsy of a Memory Bit
FIB Failure Analysis of Memory Arrays https://doi.org/10.1016/s0167-9317(04)00305-3
Ep 502: Light Measures the Transistor
Gate Oxide Metrology and Silicon Piezooptics https://doi.org/10.1016/j.tsf.2003.11.276
Ep 501: The Nanotech Toolbox
Nanotechnology Toolkit
Ep 500: Stress Draws, Films Crack
Stress-Induced Periodic Fracture Patterns in Thin Films
Ep 499: Water Cuts Copper's Grip 20x
Moisture Effects on Copper Thin Film Adhesion https://doi.org/10.1115/imece2005-81532
Ep 498: Paint Is a Mechanical System
Mechanical Aspects of Anti-Corrosive Coatings Performance Tests https://doi.org/10.21236/ada456129
Ep 497: Wet Cracks, Measured Right
Novel Adhesion Test for Environmentally Assisted Fracture in Thin Films https://doi.org/10.21236/ada456175
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